> SMART'ą (t.y. konkrečius skaičiukus) šiaip vienodai rodo visos utelės, klausimas tik kaip kas jį interpretuoja, jei pateikinėja > išvadas Good/Bad/Caution. > Bet problema tame, kad tas SMART'as toli gražu ne visada rodo problemas, ar tai ką jis rodo yra iš tiesų - tingiu dabar kartotis, > apie tai jau rašiau ne vienoj ir ne dviejose temose newsuose. Trumpai tariant, tam, kad SMART'as pradėtų rodyt aktualią info > pageidautina padaryt Suprimityvinote abu.. abiems po fail'a :) .. buvo prielaida, o jus taip garantuotai neigiate.. S.M.A.R.T. yra tam tikras fygnia.. kazka turintis bendro tarp skirtingu gamintoju.. Jis neapsiriboja vien atributu skaiciukais.. yra firmware reikaliukai, kurie juos ir pildo, galbut skaito ir galbut uzstato kazkokias busenas.. Ko gero sutiksime, kad SMART=OK, tai negarantuoja kad HDD=OK Bet taip pat matyt sutiksime, jei jau SMART sako BAD, tai HDD=siaip sau, net jei ir veikia (SMART=BAD - jo tikimybe korektiskai veikt degradavus, tai dar negarantuoja mirties). Is esmes S.M.A.R.T = kaip sinoptikai.. "siaip neturetu lyti, bet truputi gali, tai jei ka paimk sketi".. Ko nelabai atkaliau, tai skaityt tu skaiciuku ir issilukstenti tuos Threshold'us (ne 0-253 value formatais). Buvo cia man kadaise pakliuves mirtininkas 2,5" Samsung 160GB.. isskaiciau, kad jis turi labai mazai remap sektoriu.. o bad'u turejo kruva.. likus vien tik nenuskaitomai info dariau remap'us.. kazka pabandydavau dar patraukti is jo.. galu gale baigesi tie sektoriai.. SMART=BAD tik ijungus kompa.. ir ate diskeliui.. visi softai tam pritare.. http://www.hgst.com/sites/default/files/resources/TSZ7K500_Std_Model_OEMSpec_v3.2.pdf 12.8 S.M.A.R.T. Function ...................................52 14 COMMAND DESCRIPTIONS ......................74 14.41 S.M.A.R.T Function Set (B0h)...............142 <<< 15psl info 14.42 Standby (E2h/96h) .................................157 12.8.4 Threshold exceeded condition If one or more attribute values are less than or equal to their corresponding attribute thresholds, then the device reliability status is negative, indicating an impending degrading or faulty condition. 14.41.2.10 Self-test failure check point This byte indicates the section of self-test where the device detected a failure. 14.41.3.2 Individual Thresholds Data Structure The following defines the 12 bytes that make up the information for each Threshold entry in the Device Attribute Thresholds Data Structure. Attribute entries in the Individual Threshold Data Structure is in the same order and correspond to the entries in the Individual Attribute Data Structure. 14.41.6 Self-test log data structure The following defines the 512 bytes that make up the Self-test log sector. All multi-byte fields shown in these data structures follow the ATA/ATAPI-7 specifications for byte ordering. Self-test execution status 1 n*18h+03h Life time power on hours 2 n*18h+04h Self-test failure check point 1 n*18h+06h 14.41.8 Error Reporting The following table shows the values returned in the Status and Error Registers when specific error conditions are encountered by a device. Error Condition Status Register Error Register A S.M.A.R.T. FUNCTION SET command was received by the device without the required key being loaded into the LBA High and LBA Mid registers. / 51h / 04h